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  transistors 1 publication date: march 2003 sjc00119bed 2sc2634 silicon npn epitaxial planar type for low-frequency and low-noise amplification complementary to 2sa1127 features ? low noise voltage nv ? high forward current transfer ratio h fe absolute maximum ratings t a = 25 c parameter symbol rating unit collector-base voltage (emitter open) v cbo 60 v collector-emitter voltage (base open) v ceo 55 v emitter-base voltage (collector open) v ebo 7v collector current i c 100 ma peak collector current i cp 200 ma collector power dissipation p c 400 mw junction temperature t j 150 c storage temperature t stg ? 55 to + 150 c parameter symbol conditions min typ max unit collector-base voltage (emitter open) v cbo i c = 10 a, i e = 060v collector-emitter voltage (base open) v ceo i c = 1 ma, i b = 055v emitter-base voltage (collector open) v ebo i e = 10 a, i c = 07v base-emitter voltage v be v ce = 1 v, i c = 30 ma 1 v collector-base cutoff current (emitter open) i cbo v cb = 10 v, i e = 0 1 100 na collector-emitter cutoffcurrent (base open) i ceo v ce = 10 v, i b = 0 0.01 1.00 a forward current transfer ratio * h fe v ce = 5 v, i c = 2 ma 180 700 ? collector-emitter saturation voltage v ce(sat) i c = 100 ma, i b = 10 ma 0.6 v transition frequency f t v cb = 5 v, i e = ? 2 ma, f = 200 mhz 200 mhz noise voltage nv v ce = 10 v, i c = 1 ma, g v = 80 db 150 mv r g = 100 k ? , function = flat electrical characteristics t a = 25 c 3 c 5.0 0.2 0.7 0.1 0.45 +0.15 ?0.1 2.5 +0.6 ?0.2 0.45 +0.15 ?0.1 2.5 123 +0.6 ?0.2 4.0 0.2 5.1 0.2 12.9 0.5 2.3 0.2 0.7 0.2 unit: mm 1: emitter 2: collector 3: base eiaj: sc-43a to-92-b1 package note) 1. measuring methods are based on japanese industrial standard jis c 7030 measuring methods for transistors. 2. * : rank classification rank r s t h fe 180 to 360 260 to 520 360 to 700 this product complies with the rohs directive (eu 2002/95/ec). maintenance/ discontinued maintenance/discontinued includes following four product lifecycle stage. planed maintenance type maintenance type planed discontinued typed discontinued type please visit following url about latest information. http://panasonic.net/sc/en
2sc2634 2 sjc00119bed v ce(sat) ? i c h fe ? i c f t ? i e p c ? t a i c ? v ce i c ? v be c ob ? v cb nf ? i e nv ? i c 0 200 160 40 120 80 0 500 400 300 200 100 collector power dissipation p c ( mw ) ambient temperature t a ( c ) 012 10 8 26 4 0 120 100 80 60 40 20 t a = 25 c 250 a 200 a 350 a 300 a 150 a 100 a 50 a i b = 400 a collector current i c ( ma ) collector-emitter voltage v ce ( v ) 0 2.0 1.6 0.4 1.2 0.8 0 120 100 80 60 40 20 v ce = 5 v t a = 75 c ? 25 c 25 c base-emitter voltage v be ( v ) collector current i c ( ma ) 0.1 1 10 100 0.01 0.1 1 10 100 i c / i b = 10 t a = 75 c 25 c ? 25 c collector-emitter saturation voltage v ce(sat) ( v ) collector current i c ( ma ) 0.1 1 10 100 0 1 000 800 600 400 200 v ce = 5 v t a = 75 c 25 c ? 25 c forward current transfer ratio h fe collector current i c ( ma ) ? 1 ? 10 ? 100 0 400 300 100 200 v cb = 5 v t a = 25 c transition frequency f t ( mhz ) emitter current i e ( ma ) 1 10 100 0 10 8 6 4 2 i e = 0 f = 1 mhz t a = 25 c collector-base voltage v cb ( v ) collector output capacitance (common base, input open circuited) c ob (pf) ? 10 ? 100 ? 1 000 0 8 6 2 4 v ce = 5 v r g = 1 k ? t a = 25 c f = 100 hz 10 khz 1 khz noise figure nf ( db ) emitter current i e ( a ) 0.01 0.1 1 0 120 100 80 60 40 20 v ce = 10 v g v = 80 db function = flat 5 k ? r g = 100 k ? 22 k ? noise voltage nv ( mv ) collector current i c ( ma ) this product complies with the rohs directive (eu 2002/95/ec).
request for your special attention and precautions in using the technical information and semiconductors described in this book (1) if any of the products or technical information described in this book is to be exported or provided to non-residents, the laws and regulations of the exporting country, especially, those with regard to security export control, must be observed. (2) the technical information described in this book is intended only to show the main characteristics and application circuit examples of the products, and no license is granted under any intellectual property right or other right owned by our company or any other company. therefore, no responsibility is assumed by our company as to the infringement upon any such right owned by any other company which may arise as a result of the use of technical information described in this book. (3) the products described in this book are intended to be used for standard applications or general electronic equipment (such as office equipment, communications equipment, measuring instruments and household appliances). consult our sales staff in advance for information on the following applications: ? special applications (such as for airplanes, aerospace, automobiles, traffic control equipment, combustion equipment, life support systems and safety devices) in which exceptional quality and reliability are required, or if the failure or malfunction of the prod- ucts may directly jeopardize life or harm the human body. ? any applications other than the standard applications intended. (4) the products and product specifications described in this book are subject to change without notice for modification and/or im- provement. at the final stage of your design, purchasing, or use of the products, therefore, ask for the most up-to-date product standards in advance to make sure that the latest specifications satisfy your requirements. (5) when designing your equipment, comply with the range of absolute maximum rating and the guaranteed operating conditions (operating power supply voltage and operating environment etc.). especially, please be careful not to exceed the range of absolute maximum rating on the transient state, such as power-on, power-off and mode-switching. otherwise, we will not be liable for any defect which may arise later in your equipment. even when the products are used within the guaranteed values, take into the consideration of incidence of break down and failure mode, possible to occur to semiconductor products. measures on the systems such as redundant design, arresting the spread of fire or preventing glitch are recommended in order to prevent physical injury, fire, social damages, for example, by using the products. (6) comply with the instructions for use in order to prevent breakdown and characteristics change due to external factors (esd, eos, thermal stress and mechanical stress) at the time of handling, mounting or at customer's process. when using products for which damp-proof packing is required, satisfy the conditions, such as shelf life and the elapsed time since first opening the packages. (7) this book may be not reprinted or reproduced whether wholly or partially, without the prior written permission of matsushita electric industrial co., ltd.


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